Download datasheet. Learn more. Download brochure. View Resources. Download Datasheet. アカウントをお持ちですか？ アカウントを登録する. 製品情報を探す オンラインオーダー サービス サポート. Connect Your Lab サインイン クイックオーダー. Search Thermo Fisher Scientific. Search All. Electrical Failure Analysis Systems Isolate subtle electrical issues that affect yield, performance, or reliability. Contact us. Meet our newest innovative products Our latest next-generation products focus on advanced analytical capabilities for failure analysis and process control.
Technology SEM Desktop SEM TEM DualBeam EFA Systems Circuit Edit microCT Sample Vitrification Software Accessories. Technology SEM Desktop SEM TEM DualBeam Circuit Edit EFA Systems microCT Software Sample Vitrification Accessories. Life Science Materials Science Semiconductors. Krios G4 Cryo-TEM Improved ergonomics Fits more easily into new and existing labs Maximized productivity and automation Best image quality for high-resolution 3D reconstruction.
View product Download datasheet. Spectra TEM Highest-resolution structural and chemical information at the atomic level Flexible high-tension range from kV Three lens condenser system. Glacios Cryo-TEM Flexible Accelerating Voltage kV Industry-leading Autoloader for cryogenic sample manipulation Small footprint Enhanced ease-of-use. Metrios AX TEM Automation options to support quality, consistency, metrology, and reduced OPEX Leverages machine learning for superior autofunctions and feature recognition Workflows for both in-situ and ex-situ lamella preparation.
Themis ETEM Precise control and knowledge of sample temperature Improved sample stability, navigation, and assisted sample drift correction in x, y, and z axes Advancing high-quality imaging and movie acquisition functions.
Talos FS TEM Precise chemical composition data High performance imaging and precise compositional analysis for dynamic microscopy Features Velox Software for fast and easy acquisition and analysis of multimodal data. Talos FC TEM Flexible EDS analysis reveals chemical information High-contrast, high-quality TEM and STEM imaging Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed. ExSolve WTP DualBeam Can prepare site-specific, 20 nm thick lamellae on whole wafers up to mm in diameter Addresses needs requiring automated, high-throughput sampling at advanced technology nodes.
Helios G4 EXL DualBeam Precise control and knowledge of sample temperature Improved sample stability, navigation, and assisted sample drift correction in x, y, and z axes Advancing high-quality imaging and movie acquisition functions. Helios 5 DualBeam Fully automated, high-quality, ultra-thin TEM sample preparation High throughput, high resolution subsurface and 3D characterization Rapid nanoprototyping capabilities.
Helios 5 PFIB DualBeam Gallium-free STEM and TEM sample preparation Multi-modal subsurface and 3D information Next-generation 2. Helios G4 PFIB DualBeam Gallium-free STEM and TEM sample preparation Multi-modal subsurface and 3D information Next-generation 2.
Helios 5 Laser PFIB System Fast, millimeter-scale cross sections Statistically relevant deep subsurface and 3D data analysis Shares all capabilities of the Helios 5 PFIB platform. Helios Hydra DualBeam 4 fast switchable ion species Xe, Ar, O, N for optimized PFIB processing of a widest range of materials Ga-free TEM sample preparation Extreme high resolution SEM imaging.
Aquilos 2 Cryo-FIB Automation enables production of multiple lamellas Target and extract your structure of interest with lift-out nano-manipulator 3D visualization for high-resolution tomography.
Scios 2 DualBeam Full support of magnetic and non-conductive samples High throughput subsurface and 3D characterization Advanced ease of use and automation capabilities.
Axia ChemiSEM Live quantitative elemental mapping High fidelity scanning electron microscopy imaging Flexible and easy to use, even for novice users Easy maintenance. Verios 5 XHR SEM Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range Easy access to beam landing energies as low as 20 eV Excellent stability with piezo stage as standard.
Quattro ESEM Ultra-versatile high-resolution FEG SEM with unique environmental capability ESEM Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation. Prisma E SEM Entry-level SEM with excellent image quality Easy and quick sample loading and navigation for multiple samples Compatible with a wide range of materials thanks to dedicated vacuum modes. Apreo 2 SEM High-performance SEM for all-round nanometer or sub-nanometer resolution In-column T1 backscatter detector for sensitive, TV-rate materials contrast Excellent performance at long working distance 10 mm.
VolumeScope 2 SEM Isotropic 3D data from large volumes High contrast and resolution in high and low vacuum modes Simple switch between normal SEM use and serial block-face imaging. Phenom ParticleX Steel Desktop SEM SEM and EDS integrated Ease of use Sub-micrometer inclusions. Hyperion II System Atomic Force Probing Localize transistor faults Integrated PicoCurrent CAFM. Meridian WS-DP System High-sensitivity, low-noise, low-voltage photon emission detection with broadband DBX or InGaAs camera systems Multi-wavelength laser scanning microscope for scan chain analysis, frequency mapping, transistor probing and isolation of faults.
View product Learn more. Meridian IV System High sensitivity extended-wavelength DBX photon emission detection Standard InGaAs photon emission detection Laser Scanning Microscope with multiple wavelength options.
Orion3 Electrostatic Discharge Tester Charged device model testing Dual high resolution color cameras Test densities to less than 0. Celestron Test System Wafer and package level TLP testing High current TLP pulse generato Can be interfaced with semiautomatic probers Intuitive software for control and report generation.
HeliScan microCT Advanced helical scanning and iterative reconstruction technology High resolution x-ray source below nm Process, analyze, and visualize samples.
Reference manual is here. Could you support me? FM synthesizers make sounds with Frequency Modulation. FM brings rich and brilliant sounds which are impossible to create with analog one. It makes very complex waves with simple modulations.
The same method is used for a radio. The synthesizer gained much popularity in the s. This app lets you make sounds freely with voice parameters. Almost all parameters but multi-timbres, unisons, filters, and delay are compatible with DX7 mark I. Audio Unit v3 compatible. Audiobus compatible. You can manage the hardware DX7 when it is connected with external MIDI cables. Supports DX7 System Exclusive Messages SysEx and syx files. Supports Zip files. You may be able to find a lot of patches on the internet.
A Multi-timbre, Unison function is included. Introducing Audiobus support: Now you can stream live audio directly to other Audiobus-compatible apps! us for more information.
Detune did not work if Engine Version is 1 or above. This bug is fixed on version 2. Multiple feedback operators did not sound. Algorithm 4 and 6 This bug is fixed on version 2. Function Parameters were not saved. The parameters will be saved in a dxpf file on version 2. LFO on amplitude modulation was inverted. Saw up should have increased the amplitude but actually decreased. This bug is fixed on version 1.
The previous Audio Units are deprecated. This is because they fail validation in Logic Pro and MainStage. I plan to keep them for compatibility, but please attention. Added support for iPad portrait screen.
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KQ Dixie – Kira Q Tech
Velox Software An experiments panel on the left side of the processing window. Reference manual is here. Contact us.
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現在のPOD HD Pro X Setup - FS MODEの設定を示す以下のような画面が表示されます。 Sample Rate（ノブ 2）：サンプル・レートを: kHz、48kHz、kHz または 現在のPOD HD Pro X Setup - FS MODEの設定を示す以下のような画面が表示されます。 Sample Rate（ノブ 2）：サンプル・レートを: kHz、48kHz、kHz または VTEM, Work-N-Play, Xdeck, X-Form, and XMON are either SYNC HD supports all Pro Tools sample rates, Support and Downloads Contact Avid Customer
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Logic pro x sample rate setting free download.Logic Pro for PC and Mac
Prisma E SEM Entry-level SEM with excellent image quality Easy and quick sample loading and navigation for multiple samples Compatible with a wide range of materials thanks to dedicated vacuum modes. Electrical Feedthrough Aetting Holder Connect electrical probes to the sample for settin situ measurements Sample can be height adjusted from 0—25 mm manually Measurements of probe logic pro x sample rate setting free download. Scios 2 DualBeam Full support of magnetic and non-conductive samples High throughput subsurface and 3D characterization Advanced ease of use and automation capabilities. Added support for iPad portrait screen.
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